Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips
نویسندگان
چکیده
منابع مشابه
Vacuum tunneling of superconducting quasiparticles from atomically sharp scanning tunneling microscope tips
We report on the study of atomically sharp superconducting tips for scanning tunneling microscopy and spectroscopy. The results clearly show vacuum tunneling of superconducting quasiparticles from atomically sharp tips. Observed deviations of the energy gap of the superconducting tip from its bulk value are attributed to the proximity effect. We show that a combination of a superconducting tip ...
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Reproducible fabrication of Scanning Tunneling Microscope tips is carried out following an electrochemical procedure widely reported. Tips are made from 0.5 diameter tungsten wire. Controlling fabrication parameters (immersion in the electrochemical solution, current-voltage ranges, duration of the process, among others) we achieve aspect ratios of 0.68 and tip radii of 330 nm in the best case....
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• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website. • The final author version ...
متن کاملHigh-yield synthesis of conductive carbon nanotube tips for multiprobe scanning tunneling microscope.
We have established a fabrication process for conductive carbon nanotube (CNT) tips for multiprobe scanning tunneling microscope (STM) with high yield. This was achieved, first, by attaching a CNT at the apex of a supporting W tip by a dielectrophoresis method, second, by reinforcing the adhesion between the CNT and the W tip by electron beam deposition of hydrocarbon and subsequent heating, an...
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ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
سال: 2013
ISSN: 2166-2746,2166-2754
DOI: 10.1116/1.4812796